US Patent Issued to SAMSUNG ELECTRONICS on Nov. 3 for "Scanning electron microscope image distortion correction method, and semiconductor manufacturing method using the correction method" (South Korean Inventors)

पोस्टेड ऑन: 2026-11-03

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,160, issued on Nov. 3, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Scanning electron microscope image distortion ... और पढ़ें

US Patent Issued to Bala Sundarajan on Nov. 3 for "Systems and methods for adjusting appearance of objects in medical images" (California Inventors)

पोस्टेड ऑन: 2026-11-03

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ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,161, issued on Nov. 3, was assigned to Bala Sundarajan (Borough of Malvern, Pa.). "Systems and methods for adjusting appearance of objects i... और पढ़ें

US Patent Issued to TENCENT EUROPE (FRANCE) on Nov. 3 for "Methods and systems for automatic video quality evaluation with feature-based selection models" (French Inventor)

पोस्टेड ऑन: 2026-11-03

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ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,162, issued on Nov. 3, was assigned to TENCENT EUROPE (FRANCE) SAS (Paris). "Methods and systems for automatic video quality evaluation with... और पढ़ें

US Patent Issued to Pilz on Nov. 3 for "Method and system for detecting a configuration of a modular safety controller" (German Inventor)

पोस्टेड ऑन: 2026-11-03

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ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,163, issued on Nov. 3, was assigned to Pilz GmbH & Co. KG (Ostfildern, Germany). "Method and system for detecting a configuration of a modul... और पढ़ें

US Patent Issued to KCI HOLDINGS on Nov. 3 for "Systems and methods for assessing deviations of a surface from a design plan" (Maryland, Georgia Inventors)

पोस्टेड ऑन: 2026-11-03

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ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,164, issued on Nov. 3, was assigned to KCI HOLDINGS INC. (Sparks, Md.). "Systems and methods for assessing deviations of a surface from a de... और पढ़ें

US Patent Issued to Hangzhou Ruisheng Software on Nov. 3 for "Method and apparatus for determining whether container of plant is suitable for plant maintenance" (Chinese Inventors)

पोस्टेड ऑन: 2026-11-03

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ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,165, issued on Nov. 3, was assigned to Hangzhou Ruisheng Software Co. Ltd. (Zhejiang, China). "Method and apparatus for determining whether ... और पढ़ें

US Patent Issued to MITSUBISHI ELECTRIC on Nov. 3 for "Crack inspection device, crack inspection system, and crack inspection method" (Japanese Inventors)

पोस्टेड ऑन: 2026-11-03

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ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,166, issued on Nov. 3, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo). "Crack inspection device, crack inspection system, and crack inspe... और पढ़ें

US Patent Issued to SAFRAN AIRCRAFT ENGINES on Nov. 3 for "Tomographic analysis method" (French Inventors)

पोस्टेड ऑन: 2026-11-03

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ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,167, issued on Nov. 3, was assigned to SAFRAN AIRCRAFT ENGINES (Paris). "Tomographic analysis method" was invented by Pierre Alfred Jean Duc... और पढ़ें

US Patent Issued to CANON on Nov. 3 for "Information processing apparatus, information processing method, and non-transitory computer-readable storage medium" (Japanese Inventors)

पोस्टेड ऑन: 2026-11-03

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ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,168, issued on Nov. 3, was assigned to CANON K.K. (Tokyo). "Information processing apparatus, information processing method, and non-transit... और पढ़ें

US Patent Issued to Northeast Petroleum University on Nov. 3 for "Numerical simulation method and system for effect of clay minerals on brittleness in continental shale" (Chinese Inventors)

पोस्टेड ऑन: 2026-11-03

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ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,169, issued on Nov. 3, was assigned to Northeast Petroleum University (Daqing, China). "Numerical simulation method and system for effect of... और पढ़ें

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US Patent Issued to SAMSUNG ELECTRONICS on Nov. 3 for "Scanning electron microscope image distortion correction method, and semiconductor manufacturing method using the correction method" (South Korean Inventors)

US Patent Issued to Bala Sundarajan on Nov. 3 for "Systems and methods for adjusting appearance of objects in medical images" (California Inventors)

US Patent Issued to TENCENT EUROPE (FRANCE) on Nov. 3 for "Methods and systems for automatic video quality evaluation with feature-based selection models" (French Inventor)

US Patent Issued to Pilz on Nov. 3 for "Method and system for detecting a configuration of a modular safety controller" (German Inventor)

US Patent Issued to KCI HOLDINGS on Nov. 3 for "Systems and methods for assessing deviations of a surface from a design plan" (Maryland, Georgia Inventors)

US Patent Issued to Hangzhou Ruisheng Software on Nov. 3 for "Method and apparatus for determining whether container of plant is suitable for plant maintenance" (Chinese Inventors)

US Patent Issued to MITSUBISHI ELECTRIC on Nov. 3 for "Crack inspection device, crack inspection system, and crack inspection method" (Japanese Inventors)

US Patent Issued to SAFRAN AIRCRAFT ENGINES on Nov. 3 for "Tomographic analysis method" (French Inventors)

US Patent Issued to CANON on Nov. 3 for "Information processing apparatus, information processing method, and non-transitory computer-readable storage medium" (Japanese Inventors)

US Patent Issued to Northeast Petroleum University on Nov. 3 for "Numerical simulation method and system for effect of clay minerals on brittleness in continental shale" (Chinese Inventors)